The unique design of NEC’s beam profile monitors has made them among the most popular and reliable beam diagnostic instruments available, with over 2,000 BPMs provided for customers worldwide. The NEC beam profile monitor reliably gives accurate information concerning the beam cross-section for ion beams with currents as low as 1nA for most models. Our newest model can monitor currents in the fA range.
The NEC BPM system is ideally suited for applications that require instantaneous scope display of beam cross-sectional shape and position without significantly interrupting beam transmissions. Particle beams of electrons, ions, or energetic neutrals can all be monitored.
The unique patented design of the NEC beam profile monitor relies on the collection of secondary electrons from a grounded scanning wire. This arrangement eliminates contact noise at the rotating scanning wire. Here’s how it works:
NEC provides four standard models of BPMs, with various versions and options for each model. Below are brief descriptions of each model.
The Original Beam Profile Monitor – and Most Popular Model
For Large Diameter Ion Beams
For Existing Housings
For Existing Housings & Larger Diameter Beams
The standard beam profile monitor system will routinely monitor positive or negative beams with current densities to 10nA/cm2. NEC has recently developed a low current beam profile monitor with a minimum detectable beam current in the FemptoAmp range. Please contact NEC for further information.
For a complete beam profile monitor system, the BPM must be connected to an NEC controller and a display oscilloscope.
NEC offers three beam profile monitor controllers: model FP3A, SS5A and SS6.
The digital display oscilloscope to be used with the BPM must have the following specifications:
An analog oscilloscope can be used if it has simultaneous Z axis intensification and remote
trigger. Upon request, NEC can recommend and/or supply an oscilloscope that meets the above requirements.